Barnett
Technical Services has been involved in the development of a robust,
turnkey system to automatically measure the transmission or
photoluminescence properties of optical materials (e.g., photovoltaic cells, filters).
The system incorporates
a spectrometer system in a light-tight box enclosure for operation that
can operate in both a manufacturing and an R&D environment. This
system provides an easier and
quicker way of measuring all product before shipment (rather than
measurements on a few specific points). As an R&D tool, it
provides critical
information about the coating process across a wafer.
Systems
can be configured for operation between 400 and 2500 nm on samples as
large as 300 mm in diameter. Integration into corporate data
management systems is straightforward. The table to the right
illustrates some of the parameters that can be specified for a these
systems.
 |
|
Parameter
|
Range
|
|
Spectral Range
|
400-2500
nm
|
|
Bandwidth
|
Variable
|
|
Optical Density Measured
|
0.1-100%T
|
|
Spectrometer Accuracy
|
0.1 nm
|
|
Photometric Accuracy
|
10-100%: ± 0.25%
1-10%: ± 0.10%
0.1-1%: ± 0.05%
|
|
Stray Light
|
35 dB
|
|
Beam Size
|
Variable
|
|
Wavelength Calibration
|
Ne lamp
|
|
Sample sizes
|
Up to 300 mm
|
|
Mapping Stage Travel Speed
|
75 mm/second
|
|
